Conductive Atomic Force Microscopy
by Nazmul Hasan
Chair: Robert
Location: zoom
Time: 15.00 – 16.00
Conductive Atomic Force Microscopy
by Nazmul Hasan
The use of atomic force microscopy (AFM) to detect conductivity has attracted much attention in recent years. In addition to topography for various ultra-thin systems, the device allows current measurements in several ranges from femto to micro ampere. The AFM is available in two different modes to measure conductivity: Conductive AFM (C-AFM) and Peak Force Tunneling (PF-TUNA). The latter one is a recently developed mode with several advantages and will be discussed in detail.
